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  ? features ? low drain-source on-state resistance rds(on) typ = 16 m ? (vgs = 4.5 v) ? high-speed switching : qg = 5.1 nc ? halogen-free / rohs compliant (eu rohs / ul-94 v-0 / msl:level 1 compliant) ? marking symbol: ? packaging embossed type (thermo-compression sealing) : 000 pcs / reel (standard) ? absolute maximum ratin g s ta = 25 ? c channel temperature storage temperature range note) *1 device mounted on a glass-epoxy board (see figure 1) *2 pulse test: ensure that the channel temperature does not exceed 150 ? c page 2. source 6. drain mos fet product standards FK8V03050L 4. gate 8. drain 3. source 7. drain tch 150 ? c +85 ? c tstg -55 to +150 ? c total power dissipation (steady state) *1 pd 1 w total power dissipation (t = 10 s) *1 1.5 for lithium-ion secondary battery protecion circuit for dc-dc converter 1 source 7. drain 8. drain 6. parameter of 6 unit: mm 1. source 5. drain 2. source 3. drain code D FK8V03050L silicon n-channel mosfet panasonic wmini8-f1 jeita sc-115 4. gate drain-source voltage vds 33 v 3 symbol rating unit gate-source voltage vgs ? 20 v 32 8 source current (pulsed) (body diode) *1,*2 isp (bd) 8 internal connection pin name 1. source 5. drain drain current (steady state) *1 id 3e operating ambient temperature topr -40 to a drain current (t = 10 s) *1 10 drain current (pulsed) *1,*2 idp figure1 fr4 glass-epoxy board 25.4 mm ? 25.4 mm ? 0.8 mm 2.8 2.9 (0.81) 2.4 0.3 0.16 0.65 1234 5 6 7 8 4 (g) 3 (s) (d) 5 1 (s) 2 (s) (d) 8 (d) 7 (d) 6 d o c n o . t t4 - ea - 13029 r e v i sio n . 3 e s t a b li s h e d : 2011 - 01 - 13 r e v i s e d : 2013 - 08 - 08
? electrical characteristics ta = 25 ? c ? 3 ? c static characteristics dynamic characteristics bod y diode characteristi c note) measuring methods are based on japanese industrial standard jis c 7030 measuring methods for transistors. *1 pulse test: ensure that the channel temperature does not exceed 150 ? c *2 measurement circuit for turn-on delay time/rise time/turn-off delay time/fall time page id = 4 a id = 4 a 1. 2. diode forward voltage *1 vsd is = 4 a, vgs = 0 v qg FK8V03050L mos fet product standards v 2.3 0.8 1.2 5.1 nc gate-source charge qgs 1.8 gate-drain charge qgd total gate charge vdd = 15 v, vgs = 0 to 4.5 v, id = 8 a vdd = 15 v, vgs = 10 to 0 v fall time *2 tf 10 ns rise time *2 tr 4 turn-off delay time *2 td(off) 32 70 turn-on delay time *2 td(on) 8 vdd = 15 v, vgs = 0 to 10 v 520 pf output capacitance coss 110 reverse transfer capacitance crss input capacitance ciss vds = 10 v, vgs = 0 v, f = 1 mhz m ? id = 4a, vgs = 4.5 v 16 25 2.5 v drain-source on-state resistance *1 id = 4a, vgs = 10 v rds(on)1 rds(on)2 11 15 gate-source threshold voltage vth id = 0.73 ma, vds = 10 v 1 10 ? a gate-source leakage current igss vgs = ? 16 v, vds = 0 v ? 10 ? a zero gate voltage drain current idss vds = 33 v, vgs = 0 v typ max unit drain-source breakdown voltage vdss id = 1 ma, vgs = 0 v 33 v parameter symbol conditions min 2of6 d o c n o . t t4 - ea - 13029 r e v i sio n . 3 e s t a b li s h e d : 2011 - 01 - 13 r e v i s e d : 2013 - 08 - 08
*2 measurement circuit for turn-on delay time/rise time/turn-off delay time/fall time id = 4 a page FK8V03050L mos fet product standards 3of6 vdd = 15 v vou t vin vin 0v 10v pw = 10 s d.c. Q 1 % d s g 50 ? 10% 90% 90% 10% 90% 10% vin vou t td(on) tr td(off) tf d o c n o . t t4 - ea - 13029 r e v i sio n . 3 e s t a b li s h e d : 2011 - 01 - 13 r e v i s e d : 2013 - 08 - 08
technical data ( reference ) page product standards capacitance - vds dynamic input/output characteristics FK8V03050L mos fet id - vds id - vgs 4of6 vds - vgs rds(on) - id 0 2 4 6 8 10 0 0.1 0.2 0.3 drain-source voltage vds (v) drain current id (a) 3.0 v 3.5 v 4.5 v 4.0 v vgs = 10.0 v 0 1 2 3 4 5 012345 gate-source voltage vgs (v) drain current id (a) 25 ta = 85 -40 1 10 100 110 drain current id (a) drain source on-state resistance rds(on) (m ? ) 10.0 v vgs = 4.5 v 0 0.05 0.1 0.15 0.2 0.25 0.3 0246810 gate-source voltage vgs (v) drain-source voltage vds (v) 2.0 a 4.0 a id = 8.0 a 10 100 1000 10000 0.1 1 10 100 drain-source voltage vds (v) capacitance c (pf) ciss coss crss 0 1 2 3 4 5 02468 total gate charge qg (nc) gate-source voltage vgs (v) vdd = 15 v d o c n o . t t4 - ea - 13029 r e v i sio n . 3 e s t a b li s h e d : 2011 - 01 - 13 r e v i s e d : 2013 - 08 - 08
technical data ( reference ) page product standards vth - ta rds(on) - ta safe operating area 5of6 pd - ta rth - tsw FK8V03050L mos fet 0 0.5 1 1.5 2 2.5 -50 0 50 100 150 temperature ( ) gate-source threshold voltage vth (v) 0 10 20 30 -50 0 50 100 150 temperature ( ) drain-source on-resistance rds(on) (m ? ) vgs = 4.5 v 10.0 v 0 0.5 1 1.5 0 50 100 150 temperature ta ( ? c) total power dissipation pd (w) 0.1 1 10 100 1000 0.01 0.1 1 10 100 1000 pulse width tsw (s) thermal resistance rth ( ? c/w) 0.01 0.1 1 10 100 1000 0.01 0.1 1 10 100 vds(v) ids(a) operation in this area is limited by rds(on) ta=25 , glass epoxy board ( 25.4 25.4 t0.8mm ) coated with copper foil, which has more than 300mm 2 . 10 ms 100 ms 1 s dc idp = 32 a 1 ms d o c n o . t t4 - ea - 13029 r e v i sio n . 3 e s t a b li s h e d : 2011 - 01 - 13 r e v i s e d : 2013 - 08 - 08
unit : mm page FK8V03050L mos fet product standards wmini8-f1 ? 6 of 6 land pattern (reference) (unit : mm) 0.16 +0.10 -0.05 2.9 0.1 0.65 2.8 0.1 0 to 0.02 (0.2) 0.80 0.05 0.30 +0.10 -0.05 2.4 0.1 (0.15) 1234 5 6 7 8 (5) (5) 0.65 0.65 0.65 0.4 0.65 2.4 d o c n o . t t4 - ea - 13029 r e v i sio n . 3 e s t a b li s h e d : 2011 - 01 - 13 r e v i s e d : 2013 - 08 - 08
request for your special attention and precautions in using the technical information and semiconductors described in this book (1) if any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and regulations of the exporting country, especially, those with regard to security export control, must be observed. (2) the technical information described in this book is intended only to show the main characteristics and application circuit examples of the products. no license is granted in and to any intellectual property right or other right owned by panasonic corporation or any other company. therefore, no responsibility is assumed by our company as to the infringement upon any such right owned by any other company which may arise as a result of the use of technical information described in this book. (3) the products described in this book are intended to be used for general applications (such as office equipment, communications equipment, measuring instruments and household appliances), or for specific applications as expressly stated in this book. consult our sales staff in advance for information on the following applications: ? special applications (such as for airplanes, aerospace, automotive equipment, traffic signaling equipment, combustion equipment, life support systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the products may directly jeopardize life or harm the human body. it is to be understood that our company shall not be held responsible for any damage incurred as a result of or in connection with your using the products described in this book for any special application, unless our company agrees to your using the products in this book for any special application. (4) the products and product specifications described in this book are subject to change without notice for modification and/or im- provement. at the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date product standards in advance to make sure that the latest specifications satisfy your requirements. (5) when designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions (operating power supply voltage and operating environment etc.). especially, please be careful not to exceed the range of absolute maximum rating on the transient state, such as power-on, power-off and mode-switching. otherwise, we will not be liable for any defect which may arise later in your equipment. even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure mode, possible to occur to semiconductor products. measures on the systems such as redundant design, arresting the spread of fire or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products. (6) comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (esd, eos, thermal stress and mechanical stress) at the time of handling, mounting or at customer's process. when using products for which damp-proof packing is required, satisfy the conditions, such as shelf life and the elapsed time since first opening the packages. (7) this book may be not reprinted or reproduced whether wholly or partially, without the prior written permission of our company. 20100202


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